Beth Walden
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Jul 16, 2001 → Jul 16, 2001
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6797644B2 | Method to reduce charge interface traps and channel hot carrier degradation | Electricity | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.