Boxue Chen
3Patents
2h-index
4Co-inventors
30Inventor score
Filing activity: Oct 19, 2017 → Sep 7, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10712145B2 | Hybrid metrology for patterned wafer characterization | Physics | 3 | Active |
| US11143604B1 | Soft x-ray optics with improved filtering | Electricity | 2 | Active |
| US12025575B2 | Soft x-ray optics with improved filtering | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.