Brad Eichelberger
2Patents
1h-index
7Co-inventors
30Inventor score
Filing activity: Jul 22, 2005 → Mar 15, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7678516B2 | Test structures and methods for monitoring or controlling a semiconductor fabrication process | Electricity | 11 | Active |
| US7679069B2 | Method and system for optimizing alignment performance in a fleet of exposure tools | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.