Brian E. Harding
1Patents
1h-index
4Co-inventors
25Inventor score
Filing activity: May 1, 2000 → May 1, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6391668B1 | Method of determining a trap density of a semiconductor/oxide interface by a contactless charge technique | Electricity | 8 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.