Brian Warwick
14Patents
4h-index
13Co-inventors
53Inventor score
Filing activity: Jul 3, 2002 → Sep 10, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8536889B2 | Electrically conductive pins for microcircuit tester | Electricity | 42 | Active |
| US8102184B2 | Test contact system for testing integrated circuits with packages having an array of signal and power contacts | Electricity | 13 | Active |
| US9007082B2 | Electrically conductive pins for microcircuit tester | Physics | 13 | Active |
| US6889841B2 | Interface apparatus for reception and delivery of an integrated circuit package from one location to another | Electricity | 5 | Expired |
| US7567075B2 | Single latch manual actuator for testing microcircuits, and having a mechanical interlock for controlling opening and closing | Emerging Cross-Sectional Technologies | 4 | Active |
| US8912811B2 | Test contact system for testing integrated circuits with packages having an array of signal and power contacts | Electricity | 4 | Active |
| US8937484B2 | Microcircuit tester with slideable electrically conductive pins | Electricity | 2 | Active |
| US9476936B1 | Thermal management for microcircuit testing system | Physics | 2 | Active |
| US9678106B2 | Electrically conductive pins for microcircuit tester | Emerging Cross-Sectional Technologies | 2 | Active |
| US9297832B2 | Electrically conductive pins for microcircuit tester | Emerging Cross-Sectional Technologies | 1 | Active |
| US7994808B2 | Contact insert for a microcircuit test socket | Physics | 1 | Active |
| US10073117B2 | Resilient interposer with electrically conductive slide-by pins as part of a microcircuit tester | Emerging Cross-Sectional Technologies | 1 | Active |
| US10877090B2 | Electrically conductive pins for microcircuit tester | Emerging Cross-Sectional Technologies | 0 | Active |
| US10302675B2 | Electrically conductive pins microcircuit tester | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.