Electrically conductive pins for microcircuit tester
US8536889B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 10, 2010 |
| Grant date | Sep 17, 2013 |
| Priority date | — |
| Expiry date | May 29, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R12/7082
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.