Bruno Foucher
4Patents
2h-index
3Co-inventors
33Inventor score
Filing activity: Jan 23, 2007 → Jan 31, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9058574B2 | Method for estimating the lifespan of a deep-sub-micron integrated electronic circuit | Physics | 3 | Active |
| US8175818B2 | Device and method of monitoring an environmental parameter in real time | Physics | 2 | Active |
| US8306785B2 | Electronic device for measuring leaktightness | Physics | 1 | Active |
| US9418039B2 | Device for monitoring the integrity and soundness of a mechanical structure, and method for operating such a device | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.