Inventor · Williston, VT, US

Bruno Roberto Aimi

3Patents
3h-index
10Co-inventors
43Inventor score

Filing activity: Mar 27, 1991 → Apr 12, 1996

Most-cited inventions

PatentTitleAreaCited byStatus
US5237269A Connections between circuit chips and a temporary carrier for use in burn-in tests Electricity 30 Expired
US5679609A Fabrication, testing and repair of multichip semiconductor structures having connect assemblies with fuses Electricity 19 Expired
US5661330A Fabrication, testing and repair of multichip semiconductor structures having connect assemblies with fuses Electricity 7 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.