Byeonghwan Jeon
6Patents
2h-index
12Co-inventors
48Inventor score
Filing activity: Oct 22, 1996 → Jan 17, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5883610A | Graphics overlay device | Physics | 24 | Expired |
| US5742383A | Apparatus for measuring degree of inclination of objective lens for optical pickup | Physics | 10 | Expired |
| US10474133B2 | Inspection device for inspecting wafer and method of inspecting wafer using the same | Electricity | 2 | Active |
| US10489902B2 | Inspection apparatus, semiconductor device manufacturing system including the same, and method of manufacturing a semiconductor device using the same | Physics | 1 | Active |
| US9915623B2 | Optical inspection apparatus, a method of inspecting a substrate, and a method of treating a substrate | Physics | 0 | Active |
| US10732129B2 | Apparatus for and method of performing inspection and metrology process | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.