Cecile Petitdidier
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Dec 16, 2008 → Dec 16, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8152364B2 | Method for measuring the creep of a thin film inserted between two rigid substrates, with one cantilever end | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.