Chacko C. Neroth
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Jun 18, 2002 → Jun 18, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7283659B1 | Apparatus and methods for searching through and analyzing defect images and wafer maps | Physics | 23 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.