Chaiwon Yoon
1Patents
1h-index
1Co-inventors
22Inventor score
Filing activity: Jul 28, 2021 → Jul 28, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11803435B2 | Device and method for detecting failure in MCU | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.