Device and method for detecting failure in MCU
US11803435B2 · kind B2 · utility
1Cited by
0References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 28, 2021 |
| Grant date | Oct 31, 2023 |
| Priority date | — |
| Expiry date | Feb 17, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/81
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The disclosure relates to an MCU failure detection device and method. According to the disclosure, a device for detecting a failure in a microcontroller unit (MCU) comprises a receiver receiving first watchdog output information for determining a failure from an electronic control device, a determination unit determining whether the electronic control device has a failure based on the first watchdog output information, and upon determining that the electronic control device has the failure, transmitting a first reset signal to the electronic control device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.