Charles Amsden
5Patents
2h-index
12Co-inventors
40Inventor score
Filing activity: Aug 2, 2012 → Nov 26, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8755044B2 | Large particle detection for multi-spot surface scanning inspection systems | Electricity | 21 | Active |
| US10082470B2 | Defect marking for semiconductor wafer inspection | Physics | 6 | Active |
| US10890719B2 | Optical interconnect for switch applications | Electricity | 0 | Active |
| US10178452B2 | Optical interconnect having optical splitters and modulators integrated on same chip | Electricity | 0 | Active |
| US10916462B2 | Laser marking focus feedback system having an intensity indication of reflected radiation passed through an objective lens, a beam splitter and a pinhole | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.