Charles Leverett Meissner
6Patents
4h-index
16Co-inventors
54Inventor score
Filing activity: Nov 15, 2001 → Aug 23, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7085980B2 | Method and apparatus for determining the failing operation of a device-under-test | Physics | 17 | Expired |
| US7895029B2 | System and method of automating the addition of RTL based critical timing path counters to verify critical path coverage of post-silicon software validation tools | Physics | 6 | Active |
| US8806270B2 | Method, apparatus and product for testing transactions | Physics | 4 | Active |
| US6941504B2 | Method and apparatus for test case evaluation using a cyclic redundancy checker | Electricity | 4 | Expired |
| US8516229B2 | Two pass test case generation using self-modifying instruction replacement | Physics | 2 | Active |
| US11847035B2 | Functional test of processor code modification operations | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.