Method and apparatus for determining the failing operation of a device-under-test
US7085980B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 2, 2002 |
| Grant date | Aug 1, 2006 |
| Priority date | — |
| Expiry date | Sep 23, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/263
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention provides an apparatus and a method for testing one or more electrical components. The apparatus and method execute similar portions of a test segment on a known device, i.e., a device for which it has been determined that the test segment executes successfully, and on a device-under-test (DUT), i.e., a device for which it has been determined that the test segment does not execute successfully. The results of the tests are compared to determine if the test passed or failed. The test segment is executed iteratively on the known device and the DUT, increasing or decreasing the amount of the test segment that is executed each pass until the failing instruction is identified.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.