Che-Rong Laing
3Patents
1h-index
6Co-inventors
33Inventor score
Filing activity: Dec 21, 2004 → Nov 1, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8852673B2 | Defect monitoring for resist layer | Physics | 4 | Active |
| US7728396B2 | Semiconductor structures | Performing Operations; Transporting | 0 | Active |
| US7198975B2 | Semiconductor methods and structures | Performing Operations; Transporting | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.