Che-Yen Lee
2Patents
0h-index
8Co-inventors
31Inventor score
Filing activity: Apr 28, 2010 → Oct 29, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12196687B2 | Method for inspecting pattern defects | Physics | 0 | Active |
| US8411142B2 | Intellectual surveillance system and monitoring method thereof | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.