Chen Ni Low
2Patents
2h-index
8Co-inventors
27Inventor score
Filing activity: Aug 16, 2004 → Jul 18, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7253606B2 | Framework that maximizes the usage of testhead resources in in-circuit test system | Physics | 5 | Expired |
| US7089139B2 | Method and apparatus for configuration of automated debug of in-circuit tests | Physics | 4 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.