Method and apparatus for configuration of automated debug of in-circuit tests
US7089139B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 16, 2004 |
| Grant date | Aug 8, 2006 |
| Priority date | — |
| Expiry date | Aug 17, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2846
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for configuring an automated in-circuit test debugger is presented. The novel test debug and optimization configuration technique configures expert knowledge into a knowledge framework for use by an automated test debug and optimization system for automating the formulation of a valid stable in-circuit test for execution on an integrated circuit tester. In a system that includes a rule-based controller for controlling interaction between the test-head controller of an integrated circuit tester and an automated debug system, the invention includes a knowledge framework and a rule-based editor. The knowledge framework stores test knowledge in the representation of rules that represent a debugging strategy. The rule-based editor facilitates the use of rules as knowledge to debug or optimize an in-circuit test that is to be executed on the integrated circuit tester.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.