Cheuk Wun Wong
4Patents
1h-index
7Co-inventors
30Inventor score
Filing activity: Jan 12, 2018 → Dec 23, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10705435B2 | Self-referencing and self-calibrating interference pattern overlay measurement | Physics | 6 | Active |
| US11675277B2 | Self-referencing and self-calibrating interference pattern overlay measurement | Physics | 1 | Active |
| US11231654B2 | Self-referencing and self-calibrating interference pattern overlay measurement | Physics | 0 | Active |
| US10809633B1 | Overlay control with corrections for lens aberrations | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.