Chris A. Nauert
3Patents
1h-index
6Co-inventors
37Inventor score
Filing activity: Apr 22, 1998 → Feb 11, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6046796A | Methodology for improved semiconductor process monitoring using optical emission spectroscopy | Electricity | 29 | Expired |
| US8232209B2 | Processes for forming electronic devices including polishing metal-containing layers | Electricity | 1 | Active |
| US7915169B2 | Processes for forming electronic devices including polishing metal-containing layers | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.