Chris Kenyon
2Patents
2h-index
6Co-inventors
33Inventor score
Filing activity: Dec 22, 1999 → Jul 21, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6701004B1 | Detecting defects on photomasks | Physics | 43 | Expired |
| US7691544B2 | Measurement of a scattered light point spread function (PSF) for microelectronic photolithography | Physics | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.