Chris Kirk
3Patents
2h-index
42Co-inventors
48Inventor score
Filing activity: Mar 17, 1994 → Apr 21, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5502306A | Electron beam inspection system and method | Electricity | 259 | Expired |
| US7705331B1 | Methods and systems for providing illumination of a specimen for a process performed on the specimen | Physics | 80 | Active |
| US9927371B2 | Confocal line inspection optical system | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.