Chris Kurowski
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Sep 19, 2017 → Sep 19, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10281523B2 | Techniques and circuits for on-chip jitter and phase noise measurement in a digital test environment | Electricity | 5 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.