Clint Vander Giessen
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Mar 28, 2017 → Mar 28, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10060963B2 | Probe systems, storage media, and methods for wafer-level testing over extended temperature ranges | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.