Dal Jo Lee
2Patents
2h-index
5Co-inventors
37Inventor score
Filing activity: Dec 24, 1996 → Jan 27, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5856982A | High-speed disturb testing method and word line decoder in semiconductor memory device | Physics | 3 | Expired |
| US7288949B2 | Semiconductor test interface | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.