Dale Ventura
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Sep 30, 2009 → Sep 30, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8127187B2 | Method and apparatus of ATE IC scan test using FPGA-based system | Physics | 15 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.