Inventor · Grenoble, FR

Daniel Baschiera

1Patents
1h-index
1Co-inventors
22Inventor score

Filing activity: Jan 8, 1987 → Jan 8, 1987

Most-cited inventions

PatentTitleAreaCited byStatus
US4789821A Test device for a combinatorial logic circuit and integrated circuit including such a device Physics 5 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.