Daniel E. Fulton
1Patents
1h-index
5Co-inventors
25Inventor score
Filing activity: Apr 25, 2000 → Apr 25, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6627917B1 | Method and apparatus for wafer-level burn-in | Physics | 11 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.