Danilo De Simone
2Patents
0h-index
8Co-inventors
24Inventor score
Filing activity: Dec 13, 2018 → Jun 2, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12278086B2 | Pattern height metrology using an e-beam system | Electricity | 0 | Active |
| US10818504B2 | Method for producing a pattern of features by lithography and etching | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.