Dave Bakker
2Patents
2h-index
8Co-inventors
27Inventor score
Filing activity: Jun 6, 2007 → Apr 28, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8045145B1 | Systems and methods for acquiring information about a defect on a specimen | Physics | 20 | Active |
| US8765496B2 | Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis | Electricity | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.