David A. Rauth
2Patents
1h-index
4Co-inventors
30Inventor score
Filing activity: Aug 27, 2014 → Oct 18, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9810641B2 | Systems and methods for measuring physical characteristics of semiconductor device elements using structured light | Electricity | 3 | Active |
| US10352877B2 | Systems and methods for measuring physical characteristics of semiconductor device elements using structured light | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.