David Bertucci
4Patents
3h-index
9Co-inventors
39Inventor score
Filing activity: Apr 30, 1996 → Sep 15, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6671652B2 | Clock skew measurement circuit on a microprocessor die | Electricity | 13 | Expired |
| US7142998B2 | Clock skew measurement circuit on a microprocessor die | Electricity | 8 | Expired |
| US5870408A | Method and apparatus for on die testing | Physics | 7 | Expired |
| US6952654B2 | Methods for calculating the voltage induced in a device | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.