David F. Cutilli
1Patents
0h-index
3Co-inventors
19Inventor score
Filing activity: May 26, 2015 → May 26, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9791849B2 | Defect detection process in a semiconductor manufacturing environment | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.