David Hellin
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Dec 10, 2004 → Dec 10, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7399635B2 | Impurity measuring method for Ge substrates | Emerging Cross-Sectional Technologies | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.