David Kammerlander
7Patents
1h-index
11Co-inventors
40Inventor score
Filing activity: May 11, 2017 → Mar 14, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10126355B1 | Semiconductor probe test card with integrated hall measurement features | Physics | 1 | Active |
| US11961904B2 | Semiconductor device including trench gate structure and buried shielding region and method of manufacturing | Electricity | 1 | Active |
| US12295156B2 | Semiconductor device including trench gate structure and buried shielding region and method of manufacturing | Electricity | 0 | Active |
| US12349401B2 | Semiconductor device including a trench structure having a trench dielectric structure with a gap | Electricity | 0 | Active |
| US12057473B2 | Silicon carbide device with transistor cell and clamp regions in a well region | Electricity | 0 | Active |
| US11876133B2 | Silicon carbide device with transistor cell and clamp region | Electricity | 0 | Active |
| US11211468B2 | Silicon carbide device with trench gate structure and method of manufacturing | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.