David Randall
5Patents
4h-index
18Co-inventors
46Inventor score
Filing activity: Nov 14, 2002 → May 15, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7729529B2 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | Physics | 27 | Active |
| US8111900B2 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | Physics | 20 | Active |
| US7142992B1 | Flexible hybrid defect classification for semiconductor manufacturing | Physics | 16 | Expired |
| US6959251B2 | Inspection system setup techniques | Emerging Cross-Sectional Technologies | 7 | Expired |
| US7072786B2 | Inspection system setup techniques | Emerging Cross-Sectional Technologies | 4 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.