Deborah Tibel
1Patents
1h-index
5Co-inventors
25Inventor score
Filing activity: Oct 26, 2001 → Oct 26, 2001
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6603321B2 | Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring | Electricity | 24 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.