Deny Hanan
2Patents
1h-index
2Co-inventors
30Inventor score
Filing activity: May 3, 2012 → Jan 21, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9006000B2 | Tj temperature calibration, measurement and control of semiconductor devices | Electricity | 10 | Active |
| US10578669B2 | Portable device for soft errors testing | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.