Dirk Kaehler
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Nov 10, 2005 → Nov 10, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7739900B2 | Method for testing the leakage rate of vacuum encapsulated devices | Physics | 4 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.