Dirk Stenkamp
4Patents
3h-index
11Co-inventors
40Inventor score
Filing activity: Jul 1, 2002 → Jul 22, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6678240B2 | Method for optimizing the image properties of at least two optical elements as well as methods for optimizing the image properties of at least three optical elements | Physics | 14 | Expired |
| US6903337B2 | Examining system for the particle-optical imaging of an object, deflector for charged particles as well as method for the operation of the same | Electricity | 11 | Expired |
| US6934011B2 | Method for optimizing the image properties of at least two optical elements as well as methods for optimizing the image properties of at least three optical elements | Physics | 5 | Expired |
| US7301622B2 | Method for optimizing the image properties of at least two optical elements as well as methods for optimizing the image properties of at least three optical elements | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.