Donald Cheng
3Patents
2h-index
4Co-inventors
33Inventor score
Filing activity: Jan 14, 1999 → May 5, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6350626B1 | Method of testing electromigration lifetime | Physics | 4 | Expired |
| USD520904S1 | Decorative speciality design spray | General | 3 | Expired |
| US6269315A | Reliability testing method of dielectric thin film | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.