Dorian Zahorski
4Patents
4h-index
8Co-inventors
39Inventor score
Filing activity: Jan 19, 1995 → Feb 11, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5608526A | Focused beam spectroscopic ellipsometry method and system | Physics | 507 | Expired |
| US5910842A | Focused beam spectroscopic ellipsometry method and system | Physics | 124 | Expired |
| US6734967B1 | Focused beam spectroscopic ellipsometry method and system | Physics | 103 | Expired |
| US5991037A | High spatial resolution ellipsometry device | Physics | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.