Douglas D. Do
5Patents
5h-index
2Co-inventors
42Inventor score
Filing activity: Feb 13, 1998 → Jul 31, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6175417A | Method and apparatus for detecting defects in the manufacture of an electronic device | Emerging Cross-Sectional Technologies | 46 | Expired |
| US6452677B1 | Method and apparatus for detecting defects in the manufacture of an electronic device | Emerging Cross-Sectional Technologies | 30 | Expired |
| US6960767B1 | Apparatus for measuring features of a semiconductor device | Electricity | 8 | Expired |
| US6124140A | Method for measuring features of a semiconductor device | Electricity | 7 | Expired |
| US6941007B1 | Pattern recognition with the use of multiple images | Physics | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.