Inventor · Geltendorf, DE

Eckhard Hanelt

13Patents
4h-index
21Co-inventors
60Inventor score

Filing activity: Apr 15, 1997 → Oct 2, 2018

Most-cited inventions

PatentTitleAreaCited byStatus
US6071438A Process for the production of three-dimensionally crosslinked polymeric materials having broad cholesteric reflection bands, and filters, reflectors and polarizers produced by this process Chemistry; Metallurgy 19 Expired
US5827449A Liquid-crystal mixtures, process for their preparation and their use Chemistry; Metallurgy 19 Expired
US6300454A Liquid-crystalline nematic organosiloxanes which can be crosslinked to form optically anisotropic polymer layers Physics 10 Expired
US6224664A Mixture comprising pigments having a liquid-crystalline structure with a chiral phase and its use Performing Operations; Transporting 5 Expired
US6294231A Optically anisotropic film, method of manufacturing the same, and liquid crystal display apparatus Physics 4 Expired
US6486338B1 Preparation of organosilicon compounds containing &agr;, &bgr;-unsaturated carboxylic acids Chemistry; Metallurgy 3 Expired
US10629895B2 Si/G/C-composites for lithium-ion-batteries Emerging Cross-Sectional Technologies 2 Active
US7311952B2 Liquid crystalline film with broadened reflection bandwidth and process for preparation thereof Chemistry; Metallurgy 1 Active
US11936038B2 Silicon particles having a specific chlorine content, as active anode material for lithium ion batteries Emerging Cross-Sectional Technologies 0 Active
US11154870B2 Method for grinding silicon-containing solids Emerging Cross-Sectional Technologies 0 Active
US10637050B2 Method for size-reduction of silicon and use of the size-reduced silicon in a lithium-ion battery Emerging Cross-Sectional Technologies 0 Active
US7396486B2 Polymerizable mixtures Chemistry; Metallurgy 0 Expired
US11462734B2 Method for grinding silicon-containing solids Emerging Cross-Sectional Technologies 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.