Edward Tsidilkovski
2Patents
2h-index
1Co-inventors
27Inventor score
Filing activity: Mar 28, 2003 → Mar 14, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6911350B2 | Real-time in-line testing of semiconductor wafers | Electricity | 7 | Expired |
| US7403023B2 | Apparatus and method of measuring defects in an ion implanted wafer by heating the wafer to a treatment temperature and time to substantially stabilize interstitial defect migration while leaving the vacancy defects substantially unaltered. | Electricity | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.