Edwin K. Silverman
1Patents
0h-index
5Co-inventors
19Inventor score
Filing activity: Oct 3, 2007 → Oct 3, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8644574B2 | Measurement of thin-layered structures in X-ray computer tomography | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.