Measurement of thin-layered structures in X-ray computer tomography
US8644574B2 · kind B2 · utility
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8References
20Claims
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Key dates
| Filing date | Oct 3, 2007 |
| Grant date | Feb 4, 2014 |
| Priority date | — |
| Expiry date | Aug 6, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2211/421
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method for reconstructing an image includes receiving tomographic data representative of an image signal; deriving, from the image signal, a plurality of components; identifying a spatial location associated with maximum phase congruency of the components; incorporating, into an image, an edge at the spatial location; and providing an output representative of the image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.