Emily True
8Patents
3h-index
14Co-inventors
50Inventor score
Filing activity: Aug 5, 2002 → Dec 7, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7528937B1 | Dual-sided substrate measurement apparatus and methods | Physics | 6 | Expired |
| US7751067B1 | Substrate-alignment using detector of substrate material | Physics | 6 | Active |
| US8299446B2 | Sub-field enhanced global alignment | Electricity | 5 | Active |
| US8017424B2 | Dual-sided substrate measurement apparatus and methods | Physics | 2 | Active |
| US9436103B2 | Wynne-Dyson projection lens with reduced susceptibility to UV damage | Physics | 1 | Active |
| US10269662B2 | Scanning methods for focus control for lithographic processing of reconstituted wafers | Electricity | 1 | Active |
| US7902040B1 | Dual-sided substrate measurement apparatus and methods | Physics | 0 | Active |
| USRE44116E1 | Substrate-alignment using detector of substrate material | General | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.